Integrated Tech for Defect Detection

Each model of the flaw detector from Mikrosize, a leading precision instrument manufacturer, adopts a multifunctional and multi-technology solution, fully equipped with all the ultrasonic testing (UT) technologies we provide:

Conventional ultrasonic testing

Phased Array Ultrasonic Testing (PAUT)

Diffraction Time Difference (TOFD)

Fully Focused Mode (TFM)

Phase coherence imaging (PCI)

Plane wave imaging (PWI)

Dual full focus mode/phase coherent imaging

These advanced imaging features, combined with an easy-to-use interface, enable users of all skill levels to quickly and reliably inspect welds and components.

Aging infrastructure may be affected by complex damage mechanisms such as high-temperature hydrogen induced defects (HTHA), hydrogen sulfide (H₂S), and creep damage. Due to inherent limitations related to the shape, size, and angle of the sound beam and damage, it is difficult to detect these defects using conventional ultrasound or phased array testing techniques alone. Mikrosize’s integrated technology approach ensures the ability to use different technologies and tools to correctly identify these defects— a critical advantage in maintaining infrastructure integrity.