Uncompromised Detection: Tackling Your Most Challenging Materials

Advanced Ultrasonic Flaw Detector: Precision for Demanding Industrial Applications.

Functioning as a fully-featured portable ultrasonic flaw detector, this instrument is extensively employed across a wide spectrum of industries, including large forging and casting factories, aerospace manufacturing, and petrochemical pipeline inspection. It is engineered to tackle challenging on-site inspections, from high-resolution measurements of thin materials and the evaluation of highly attenuative substances to integration with sophisticated water immersion systems. As a key product offered by Mikrosize and a prominent solution in the portfolio of Measuring Testing Instrument, this device sets a high standard for reliability and performance in the field of non-destructive testing (NDT).

A standout feature of this flaw detector is its unique fusion of simulation performance and digital advantage. By combining the powerful benefits of modern digital design with detailed dynamic echo information, its proprietary signal processing delivers additional A-scan images and brightness changes that evolve with the waveform. This innovative approach effectively compensates for the "analog feel and performance" often missing in purely digital devices, providing inspectors with a richer, more intuitive visual data set. Enhancing this further is the Intelligent Browsing Function - SmartView - which is specifically designed for displaying scanned information of critical sections and vital data for rotating components. Operators can choose from four distinct hold modes—all, peak comparison, A-scan comparison, or envelope—to achieve the most accurate waveform evaluation. Furthermore, three variable continuous modes, selectable while maintaining the envelope, offer visual assistance in defect detection and the evaluation of scanning and moving parts. Real-time detection results can be easily compared by distinguishing the color difference between the live, frozen A-scan display and a stored reference A-scan.

For inspecting materials that are notoriously difficult to penetrate, the instrument is equipped with a high-energy square wave pulse generator. The exceptionally low signal-to-noise ratio of the unit, when paired with square wave pulses, significantly reduces clutter interference, allowing for clearer signal interpretation even in the most challenging applications. In low-frequency scenarios, the square wave pulse generator allows for optimal probe matching through adjustable pulse width and voltage, making it exceptionally well-suited for detecting difficult-to-penetrate metals, non-metals, and especially complex composite materials.

The detector incorporates advanced Color Half-Span Technology, which utilizes a color bar display for easy identification of various data and spans during weld inspection, clearly distinguishing between primary and secondary echoes. The LA scan feature can dynamically alter the "real-time" A-scan color for enhanced visibility. To streamline workflow, it comes with pre-applied AWS D1.1 software to simplify welding specification calculations. It also includes a function for calculating triangular defect positions with curvature correction, automatically determining defect depth, surface distance, and acoustic path.

A comprehensive suite of defect quantification tools is available to ensure precise analysis. The optional 40 dB dynamic multi-curve DAC/TCG corrects for distance/amplitude changes caused by material attenuation and beam spread, allowing for independent editing or insertion of recorded echoes. Multiple DAC curves can be displayed simultaneously, including +/- dB curves around the original recorded DAC. Capable of recording up to 16 data points, it meets or exceeds industrial TCG requirements. Another powerful option is the DGS (Distance Gain Size) diagram, which displays special equivalent reference defect size curves to measure the distance from 25 narrowband probes to a reference defect. The integrated ERS (Equivalent Reference Defect Size) function can automatically calculate the diameter of the corresponding equivalent reference defect for any echo within the measurement gate.

Finally, for specialized inspection needs, the system can be configured for water immersion detection. This optional capability, which requires the selection of a compatible water immersion probe, is supported by an IF (interface) gate option, making it an ideal solution for applications requiring precise immersion testing methodologies. Through Mikrosize and Measuring Testing Instrument, industries have access to a versatile and powerful tool that addresses the most rigorous ultrasonic testing challenges with confidence and precision.