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Mikrosize 3D Profilometers: Multi-Mode Metrology for Precision Surface Analysis

In the demanding world of precision metrology, the 3D profilometer has emerged as a critical non-contact measurement instrument. As a premier supplier in the Measuring Testing Instrument industry, Mikrosize delivers advanced systems that integrate multiple optical technologies onto a single, automated platform. This multi-mode approach provides unparalleled versatility for high-precision surface characterization across a vast spectrum of materials and applications, from industrial quality control to cutting-edge material science research.

Multi-Mode Integration: The Core of Versatile Measurement

The fundamental advantage of a modern 3D Profilometer lies in its synergistic use of complementary non-destructive techniques. Mikrosize systems allow users to switch seamlessly between different measurement modes within the same software environment and without moving the sample, significantly enhancing data integrity and workflow efficiency.

• White Light Interferometry (WLI): This technique leverages the wave nature of light to achieve nanometer-level vertical resolution. It is exceptionally powerful for rapidly measuring rough surfaces, large step heights, and complex topographies. WLI is the preferred method for surface roughness measurement, flatness testing, and volume loss assessment in tribological studies.

• Confocal Microscopy: Using spatial pinholes to eliminate out-of-focus light, confocal microscopy constructs high-contrast 3D images by scanning the focal point vertically. It excels with transparent or multi-layered materials, highly sloped surfaces, and applications requiring supreme lateral resolution. This mode is ideal for film thickness measurement on transparent layers and for detailed inspection of fine features on curved surfaces.

The ability to instantly switch between WLI and confocal modes on a Mikrosize profilometer drastically reduces equipment costs and space requirements. It also revolutionizes analysis: a user can perform a rapid, large-area scan with WLI to locate a region of interest and then switch to confocal mode for a high-magnification, detailed analysis of a specific feature, all with perfect coordinate alignment.

Superior Imaging Compatibility for Complex Materials

A key challenge in metrology is the diverse nature of surfaces. Mikrosize 3D Profilometers are engineered to overcome these challenges, offering exceptional compatibility with a wide range of difficult-to-measure materials.

• Transparent Surfaces: The confocal mode's optical sectioning capability allows it to precisely locate the top surface of a transparent film, enabling accurate film thickness evaluation for coatings, photoresists, and optical layers without measurement artifacts.

• Curved and Sloped Surfaces: With high-numerical-aperture objectives and sophisticated algorithms, these systems provide accurate 3D morphology reconstruction of complex geometries like lenses, medical implants, and precision-machined parts.

• Challenging Materials: High-sensitivity detectors and optimized illumination ensure reliable data acquisition from low-reflectivity surfaces (e.g., carbon composites) and highly absorptive materials.

This technical complementarity makes the Mikrosize 3D Profilometer a universal tool for laboratories and quality control departments dealing with diverse and complex samples.

Powerful, Standardized Software for Actionable Insights

The hardware's potential is fully unlocked through powerful, integrated software. Mikrosize provides standardized analysis software that complies with international standards and supports comprehensive data processing:

• Morphology and Roughness Analysis: Advanced filtering and calculation of 2D & 3D texture parameters (e.g., Sa, Sq) per ISO 25178 for complete surface morphology analysis.

• Dimensional Metrology: Precise measurement of step height, angles, volumes, and distances.

• Thin-Film Characterization: Automated film thickness mapping for transparent layers.

• Data Correlation: Direct comparison of measurements from different modes on the same location for robust, traceable results.

This software ensures data is not only accurate but also traceable and compliant, which is critical for both industrial certification and academic research.

Wide-Ranging Applications Across Industries

The versatility of the 3D Profilometer makes it indispensable across numerous sectors.

Industrial Testing:

• Automotive/Aerospace: Volume wear assessment of components and step height measurement of coatings.

• Semiconductor/Electronics: Critical film thickness measurement for wafers and photoresists.

• Precision Manufacturing: Ultra-long distance thinning thickness measurement for large panels and quality control of machined parts.

Research and Development:

• Material Science: Reconstruction of surface morphology for studying growth mechanisms, corrosion, and wear.

• Biomedical Engineering: Characterizing the texture of implants and analyzing biological tissues.

• Thin-Film Development: R&D of new coatings, analyzing their uniformity and roughness.

Mikrosize: Your Trusted Partner in Metrology

As a leading supplier of Measuring Testing Instruments, Mikrosize is committed to providing complete metrology solutions. Our 3D Profilometers are backed by deep application expertise, comprehensive technical support, and a commitment to ensuring our customers achieve the highest levels of measurement accuracy and productivity. We provide the essential tools for surface roughness measurement, film thickness evaluation, and precision step height measurement, driving quality and innovation worldwide.