iSurfa-100 Benchtop Roughness Tester

Features:

●Uses imported chip sensor with resolution up to 0.01μm;

●Roughness measurement range ±1500μm, meeting high-precision industrial inspection needs;

●Supports multi-dimensional analysis of profile and roughness, covering multiple parameters (e.g., Ra, Rz, etc.);

●Import/export CAD files for profile comparison;

●Automatic programming enables rapid detection and OK/NG judgment, improving efficiency;

●Three-axis Hall joystick control for flexible and convenient operation;

●Electric column system with linear guide ensures motion stability;

●Automatic contact protection reduces stylus damage;

●Climbing angle: ascent 77°, descent 87°, suitable for complex workpiece surface inspection;

●Equipped with large-angle adjustable worktable (±30° tilt) and adjustable flat-nose pliers (0~45°);

●Supports detection of minimum internal bore of 5mm;

●Uses Class 00 (accuracy error 3μm) granite base for strong vibration resistance and long-term stability;

●Software supports one-click generation of PDF/Word/Excel reports with diverse output formats;

●Modular design (e.g., carbon fiber probe arm, hard alloy stylus) for easy replacement and low maintenance cost.

Applications:

●Automotive Manufacturing

Inspects surface roughness and profile accuracy of precision components (gears, bearings) to ensure lubrication, sealing, and fatigue life of friction pairs, preventing functional failure due to surface defects;

●Aerospace

Verifies machining quality of high-precision curved surfaces, analyzes surface waviness, and ensures aerodynamic performance and structural strength of components in extreme environments;

●Precision Electronics & Semiconductor Manufacturing

Measures nano-level roughness (Rq, Rsk) and micro-profiles to ensure signal transmission stability and prevent short circuits or signal attenuation caused by surface defects.

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Product Description

Product Description

Technical Specifications

Measurement Range	X-direction drive	120mm
	Roughness range	±1500μm
	Z1 resolution	0.01μm
	Z-axis height (column)	400mm
Profile Technical Parameters	Linearity accuracy	±（0.7+\|0.12H\|）μm
Profile Technical Parameters	Straightness	0.5μm/100mm
Roughness Technical Parameters	Linearity accuracy	≤±5%
	Residual noise	≤0.005μm
	Repeatability stability	3% of reading value
	Cutoff wavelengths	0.025、0.08、0.25、0.8、2.5、8mm
	Evaluation length	λcX1、2、3、4、5
	Resolution	0.01μm
Climbing Angle	Ascent: 77° Descent: 88°
Roughness Evaluation Parameters	Ra、Rz、(Rmax、Ry)、Rt、Rp、Rpm、Rz(jis)、Rv、R3z、Rs m、Rsk、Rk、Rc、Rpk、Rvk、Mr1、Mr2
Measurement Speed	0.05-20mm/s
Z-axis Speed	0.05-20mm/s

Standard Configuration:

Item	Quantity
Roughness Profiler Main Unit	1pc
Large-Angle Adjustable Worktable	1pc
Flat-Nose Pliers	1pc
Calibration Standards	2pcs
Stylus	2pcs
Probe Arm	1pc
Computer	1pc
Printer	1pc
Software USB Drive	1pc
Certificate of Conformity	1pc
Warranty Card	1pc
Software Operation Manual	1pc